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Study of electronic states for V thin films deposited on 6H-SiC substrates by soft X-ray emission spectroscopy

✍ Scribed by M. Hirai; H. Okazaki; R. Yoshida; M. Tajima; K. Saeki; Y. Muraoka; T. Yokoya

Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 158 KB
Volume: 256
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2009.05.120

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