✦ LIBER ✦
Study of Dopant Redistribution at the Substrate-Source/Drain p-n Junction of Nanoscale MOSFET During Progressive Breakdown
✍ Scribed by Vui-Lip Lo; Pey, K.-L.; Lim, W.-T.; Diing-Shenp Ang; Chih-Hang Tung
- Book ID
- 114618487
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 1005 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0018-9383
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