Study of damage induced by room-temperature Al ion implantation in Hg[sub 0.8]Cd[sub 0.2]Te by x-ray diffuse scattering

✍ Scribed by Renault, P. O.; Declémy, A.; Lévêque, P.; Fayoux, C.; Bessière, M.; Lefebvre, S.; Corbel, C.; Baroux, L.

• Book ID: 120450377
• Publisher: American Institute of Physics
• Year: 1997
• Tongue: English
• Weight: 416 KB
• Volume: 82
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.365588