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Study of composition and critical-point broadening in InAs/Ga[sub 1âx]In[sub x]Sb superlattices using spectroscopic ellipsometry

✍ Scribed by Wagner, J.; Schmitz, J.; Herres, N.; TraÌnkle, G.; Koidl, P.

No coin nor oath required. For personal study only.

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Study of composition and critical-point broadening in InAs/Ga[sub 1âx]In[sub x]Sb superlattices using spectroscopic ellipsometry