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Study of charge accumulation kinetics in MOS structures with intrinsic anodic oxide on InSb by measuring transient photocurrents

✍ Scribed by Avdeev, N. A. ;Gabdin, Yu. E. ;Gurtov, V. A. ;Kuznetsov, S. N.


Publisher
John Wiley and Sons
Year
1985
Tongue
English
Weight
518 KB
Volume
90
Category
Article
ISSN
0031-8965

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