𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Study of carrier concentration profiles in Al-implanted Ge by micro-Raman spectroscopy under different excitation wavelengths

✍ Scribed by Sanson, A.; Giarola, M.; Napolitani, E.; Impellizzeri, G.; Privitera, V.; Carnera, A.; Mariotto, G.


Book ID
120426440
Publisher
John Wiley and Sons
Year
2013
Tongue
English
Weight
502 KB
Volume
44
Category
Article
ISSN
0377-0486

No coin nor oath required. For personal study only.