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Study of annealing and exchange bias effects in PtMn based magnetic tunnel junction system

โœ Scribed by T. Y. Peng; Y. D. Yao; S. Y. Chen; Y. H. Wang; W. C. Chen; M. J. Gao; D. D. Tang


Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
154 KB
Volume
1
Category
Article
ISSN
1862-6351

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