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Study by X-ray photoelectron spectroscopy and X-ray diffraction of the growth of TiN thin films obtained by nitridation of Ti layers

✍ Scribed by S. Santucci; L. Lozzi; M. Passacantando; P. Picozzi; R. Alfonsetti; R. Diamanti; G. Moccia

No coin nor oath required. For personal study only.

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