𝔖 Bobbio Scriptorium
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Studies on charge trapping and interface state generation in MOS capacitors at low temperatures

✍ Scribed by Y. Yasuda; S. Zaima; M. Sakashita


Book ID
107925721
Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
376 KB
Volume
41-42
Category
Article
ISSN
0169-4332

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