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Studies of thin films grown on InAs(111) and GaP(100) in HCl etches using X-ray diffraction methods

✍ Scribed by H.F. Hsieh; H.C. Shih

Book ID: 113300699
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 751 KB
Volume: 44
Category: Article
ISSN: 0254-0584
DOI: 10.1016/0254-0584(96)80057-5

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