Studies of surface resistance of copper(II) phthalocyanine thin films by using a near-field scanning microwave microscope

✍ Scribed by Miehwa Park; Hyunjun Yoo; Sunil Yun; Eunju Lim; Kiejin Lee; Chang Hwan Chang; Man Kil Joo; Ik Jae Lee; Jae-yong Kim; Barry Friedman

• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 279 KB
• Volume: 233
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2004.03.215