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Studies of Materials at the Nanometer Scale Using Coherent X-Ray Diffraction Imaging

โœ Scribed by Sandberg, Richard L.; Huang, Zhifeng; Xu, Rui; Rodriguez, Jose A.; Miao, Jianwei


Book ID
120757354
Publisher
The Minerals, Metals & Materials Society
Year
2013
Tongue
English
Weight
841 KB
Volume
65
Category
Article
ISSN
1047-4838

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