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Studies of electrochemically grafted thin organic layers on inorganic surfaces with infrared spectroscopic ellipsometry

โœ Scribed by K. Roodenko; J. Rappich; M. Gensch; N. Esser; K. Hinrichs


Book ID
106020792
Publisher
Springer
Year
2007
Tongue
English
Weight
299 KB
Volume
90
Category
Article
ISSN
1432-0630

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The major optical technique applied in this paper is spectroscopic ellipsometry. Ellipsometry measures the polarization change of the light due to interaction with the sample surface. It is called 'spectroscopic' if the measurement is performed at various wavelengths within a spectral interval. Spec