✦ LIBER ✦

Studies of density and surface roughness of ultrathin amorphous carbon films with regards to thickness with x-ray reflectometry and spectroscopic ellipsometry

✍ Scribed by Logothetidis, S.; Stergioudis, G.

Book ID: 121308445
Publisher: American Institute of Physics
Year: 1997
Tongue: English
Weight: 309 KB
Volume: 71
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.120089

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Thickness Measurements of Thin Perfluoro

Thickness Measurements of Thin Perfluoropolyether Polymer Films on Silicon and Amorphous-Hydrogenated Carbon with X-Ray Reflectivity, ESCA and Optical Ellipsometry

✍ Michael F. Toney; C.Mathew Mate; K.Amanda Leach; Daryl Pocker 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 111 KB

Experimental techniques used to measure structural parameters of thin films such as thickness, density, and coverage provide important insights into the physical properties of these films. Structural parameters are also often used to predict the eventual performance of thin films. In this study, we

X-ray photoelectron spectroscopic studie

X-ray photoelectron spectroscopic studies of carbon fiber surfaces VIII—A comparison of type I and type II fibers and their interaction with thin resin films

✍ Carol Kozlowski; Peter M.A. Sherwood 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 811 KB