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Studies of chaos and thermal noise in a driven Josephson junction using an electronic analog

โœ Scribed by Pegrum, C.M.; Gurney, W.S.C.; Nisbet, R.M.


Book ID
114549927
Publisher
IEEE
Year
1989
Tongue
English
Weight
311 KB
Volume
25
Category
Article
ISSN
0018-9464

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A model of a transferred electron device including reactive circuit elements and realistic boundary conditions is used to study chaos. We find that any simulation of chaos is suspect if the external circuit and cathode bounda ry conditions are ignored; including them reduces the range ofparameters i