Structure of the adsorbed ethyl xanthate monolayer on copper
β Scribed by K. Laajalehto
- Book ID
- 104592784
- Publisher
- John Wiley and Sons
- Year
- 1991
- Tongue
- English
- Weight
- 317 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0142-2421
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β¦ Synopsis
Abstract
XPS intensity calculations from completely oriented and randomly oriented ethyl xanthate on copper have been made as a function of electron takeβoff angle. Corresponding experiments also were carried out using the variableβangle XPS (VAXPS) method. The results show that the completely oriented ethyl xanthate layer model at a certain stage of adsorption seems to be valid, as originally proposed by Mielczarski et al. However, there are systematic errors in the calculations, which are mainly due to uncertainties in calculated electron mean free paths and absolute values of parameters characterizing the assumed adsorption layer structure.
π SIMILAR VOLUMES
Dedicated to Professor Wiktor Kemula on the occasion of his 70th birthday. ~'\* All potential values are given vs. SCE. \* This is an average .value from 36 experiments performed with the same mineral specimen, thoroughly polished before each measurement. \*\* All the experiments with the exception
it is still difficult to obtain high-grade components with satis-Spectroscopic studies of the interaction of ethyl xanthate solufactory efficiency. In order to control a selective separation tion (C 2 H 5 OCS 0 2 ) with mineral samples of chalcopyrite (CuFeS 2 ), to a fair degree, it is necessary to