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Structure of the adsorbed ethyl xanthate monolayer on copper

✍ Scribed by K. Laajalehto


Book ID
104592784
Publisher
John Wiley and Sons
Year
1991
Tongue
English
Weight
317 KB
Volume
17
Category
Article
ISSN
0142-2421

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✦ Synopsis


Abstract

XPS intensity calculations from completely oriented and randomly oriented ethyl xanthate on copper have been made as a function of electron take‐off angle. Corresponding experiments also were carried out using the variable‐angle XPS (VAXPS) method. The results show that the completely oriented ethyl xanthate layer model at a certain stage of adsorption seems to be valid, as originally proposed by Mielczarski et al. However, there are systematic errors in the calculations, which are mainly due to uncertainties in calculated electron mean free paths and absolute values of parameters characterizing the assumed adsorption layer structure.


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