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Structure of Oxygen-Related Defect Centers in Ge 1- x Si x Alloys Studied by Extended Energy-Loss Fine Structure Analysis

✍ Scribed by Muto, Shunsuke; Sugiyama, Hiroshi; Yonenega, Ichiro; Tanabe, Tetsuo


Book ID
121747414
Publisher
Institute of Pure and Applied Physics
Year
2005
Tongue
English
Weight
198 KB
Volume
44
Category
Article
ISSN
0021-4922

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