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Structure of corrosion film formed on copper exposed to controlled corrosive environment

โœ Scribed by M. Reid; D. A. Tanner; S. Belochapkine; L. F. Garfias


Publisher
John Wiley and Sons
Year
2009
Tongue
German
Weight
201 KB
Volume
60
Category
Article
ISSN
0947-5117

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โœฆ Synopsis


Abstract

This paper describes a transmission electron microscopy (TEM) investigation of copper coupons exposed to a corrosive mixed flowing gas environment (MFG). A focused ion beam (FIB) liftโ€out technique was used to extract electron transparent specimens for TEM investigation. A duplex corrosion film comprising cuprite (Cu~2~O) and chalcocite (Cu~2~S) developed on the copper substrate. The oxide demonstrated a dense morphology with evidence of chlorine in the oxide layer showing that chlorine plays an important role in the corrosion of copper transforming the protective Cu~2~O layer to a nonโ€protective layer. The outer layer of the Cu~2~S demonstrated a porous morphology allowing easy penetration of water and gases.


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