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Structure of amorphous silicon investigated by EXAFS

✍ Scribed by C.J. Glover; G.J. Foran; M.C. Ridgway


Book ID
114166305
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
162 KB
Volume
199
Category
Article
ISSN
0168-583X

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X-ray absorption measurements at the K-edge of silicon have been done in transmission mode on three powdered samples of porous silicon (p-Si) with 50%, 65% and 80% porosity, prepared by decreasing the HF content in the anodic solution. The analysis of EXAFS reveals a crystal-like structure of p-Si a