Structure determination using X-ray fluorescence interferometry

✍ Scribed by Yanjun Ma

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 446 KB
• Volume: 230
• Category: Article
• ISSN: 0009-2614
• DOI: 10.1016/0009-2614(94)01176-1

✦ Synopsis

The possibility of structure determination using the interference of fluorescence X-rays excited with monochromatic X-rays is investigated. The principle of this technique is the resonant inelastic scattering approach to the X-ray absorption-emission problem. Using a model calculation, we found that it is possible to determine the interatomic distances between two interacting identical atoms to a few percent of the wavelength of the X-ray. This technique can be applied to randomly oriented samples due to alignment by the polarization of the photons.