Structure-Dependent Electrical Properties of Carbon Nanotube Fibers
✍ Scribed by Q. W. Li; Y. Li; X. F. Zhang; S. B. Chikkannanavar; Y. H. Zhao; A. M. Dangelewicz; L. X. Zheng; S. K. Doorn; Q. X. Jia; D. E. Peterson; P. N. Arendt; Y. T. Zhu
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 233 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0935-9648
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✦ Synopsis
Spun carbon nanotube (CNT) fibers have great potential for conducting and sensing applications owing to their unique, tunable electrical properties. [1][2][3][4][5] Here we report the electron transport properties of neat, well-aligned CNT fibers spun from arrays of millimeter-long CNTs. The conductivity of asspun CNT fibers is around 595.2 S cm -1 at room temperature, and its variation with temperature shows a semiconductive behavior from 300 to 75.4 K. The electron transport was found to follow a three-dimensional (3D) hopping mechanism. [6] Importantly, it was found that chemical treatments may significantly affect the conductivities of as-spun fibers. Oxidizing the CNT fibers in air or HNO 3 increased the conductivities, while covalent bonding of Au nanoparticles to the CNT fibers remarkably improved conductivity and changed conduction behavior. Conversely, annealing CNT fibers in Ar + 6 % H 2 at 800 °C or under the CNT array growth conditions at 750 °C led to a dramatic decrease in conductivity.
Owing to their conjugated and highly anisotropic 1D structures, carbon nanotubes (CNTs) are a fascinating new class of electronic materials from both theoretical and applied standpoints. [7] The excellent conductivities of CNTs and their ability to carry very high current density, along with their high thermal conductivity, chemical stability, and mechanical strength, make CNTs uniquely promising for a broad range of applications, including building blocks for nanoscale electronic devices, microsensors for bio-agents and chemicals, and power cables for space shuttles. [8][9][10] The electrical resistivity q of individual CNTs has been measured under ballistic conductions to be as low as 10 -6 X cm [11,12] for single-walled and
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