✦ LIBER ✦
Structure characterization of hard materials by precession electron diffraction and automatic diffraction tomography: 6H–SiC semiconductor and Ni 1+ x Te 1 embedded nanodomains
✍ Scribed by Sarakinou, E; Mugnaioli, E; Lioutas, Ch B; Vouroutzis, N; Frangis, N; Kolb, U; Nikolopoulos, S
- Book ID
- 120508943
- Publisher
- Institute of Physics
- Year
- 2012
- Tongue
- English
- Weight
- 970 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0268-1242
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