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Structure and stability of cobalt-silicon-germanium thin films

✍ Scribed by Peter T. Goeller; Boyan I. Boyanov; Dale E. Sayers; Robert J. Nemanich

Book ID: 114169440
Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 480 KB
Volume: 133
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(97)00458-8

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