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Structure and optoelectronic properties of multi-element oxide thin film

โœ Scribed by Ruei-Sung Yu; Chueh-Jung Huang; Rong-Hsin Huang; Chung-Hsing Sun; Fuh-Sheng Shieu


Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
830 KB
Volume
257
Category
Article
ISSN
0169-4332

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๐Ÿ“œ SIMILAR VOLUMES


Dielectric Properties of Tin Oxide Thin
โœ Dr. J. Siva Kumar; Dr. U. V. Subba Rao ๐Ÿ“‚ Article ๐Ÿ“… 1991 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 260 KB ๐Ÿ‘ 1 views

Thin films of several thicknesses in the form of MIM structures are prepared from the powders of tin oxide (SnO,) by thermal evaporation technique in a vacuum of Torr. The dielectric properties of tin oxide film capacitors have been studied with temperatures varying from 77 to 400 K and also with fr