Structure and Optical Properties of Ferroelectric PbZr 0.40 Ti 0.60 O 3 Films Grown on LaNiO 3 −Coated Platinized Silicon Determined by Infrared Spectroscopic Ellipsometry

✍ Scribed by Hu, Z. G.; Li, Y. W.; Zhu, M.; Zhu, Z. Q.; Chu, J. H.

• Book ID: 127095803
• Publisher: American Chemical Society
• Year: 2008
• Tongue: English
• Weight: 130 KB
• Volume: 112
• Category: Article
• ISSN: 1932-7447
• DOI: 10.1021/jp801566b