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Structure and growth of dotriacontane films on SiO2 and Ag(111) surfaces: synchrotron X-ray scattering and molecular dynamics simulations

✍ Scribed by Mo, H. ;Trogisch, S. ;Taub, H. ;Ehrlich, S. N. ;Volkmann, U. G. ;Hansen, F. Y. ;Pino, M.

Book ID: 105362709
Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 261 KB
Volume: 201
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.200404894

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