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Structure and Electrical Transport Property of a Silicopnictide ZrCuSiP

โœ Scribed by Hideki Abe; Kenji Yoshii


Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
154 KB
Volume
165
Category
Article
ISSN
0022-4596

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โœฆ Synopsis


A silicopnictide ZrCuSiP was prepared through the reaction between ZrCuSi alloy and red phosphor in evacuated quartz ampoules. Rietveld analysis of the powder X-ray di4raction pattern revealed that ZrCuSiP has the ZrCuSiAs-type structure (P4/nmm) with the lattice constants of a โ€ซุโ€ฌ 0.35671(1) nm and c โ€ซุโ€ฌ 0.94460(4) nm. Electrical resistivity measurements at temperatures from 5 to 300 K indicated that ZrCuSiP is a metallic compound.

2002 Elsevier Science (USA)


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