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Structure and electrical properties of polycrystalline SiGe films grown by molecular beam deposition

✍ Scribed by I. B. Chistokhin; A. K. Gutakovskiĭ; A. S. Deryabin


Book ID
111443739
Publisher
Springer
Year
2007
Tongue
English
Weight
230 KB
Volume
41
Category
Article
ISSN
1063-7826

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