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Structure analysis of crystals and their defects by HREM

✍ Scribed by L.A. Bursill

Book ID
103490914
Publisher
Elsevier Science
Year
1982
Weight
524 KB
Volume
13
Category
Article
ISSN
0047-7206

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Extended Defects Formation in Si Crystal
Extended Defects Formation in Si Crystals by Clustering of Intrinsic Point Defects Studied by in-situ Electron Irradiation in an HREM
✍ Fedina, L. ;Gutakovskii, A. ;Aseev, A. ;Van Landuyt, J. ;Vanhellemont, J. πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 515 KB

In situ irradiation experiments in a high resolution electron microscope JEOL-4000EX at room temperature resulted in discovery of the isolated and combined clustering of vacancies and selfinterstitial atoms on {111}-and {113}-habit planes both leading to an extended defect formation in Si crystals.