Structure Analysis of Advanced Nanomaterials: Nanoworld by High-Resolution Electron Microscopy

✍ Scribed by Takeo Oku

• Publisher: De Gruyter
• Year: 2014
• Tongue: English
• Leaves: 180
• Category: Library

✦ Synopsis

High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes.

• Offers a comprehensive discussion of structure analysis in nanomaterials.
• Shows ways to utilize high resolution electron microscopy on nanostructured materials.
• A microscopic understanding of the nanoworld.

✦ Table of Contents

Preface
Contents
Table for physical constants
1 Introduction
1.1 Characteristic of electron microscopy
1.2 What information can be obtained by electron microscopy?
1.3 Various types of electron microscopy
2 Structure and principle of electron microscopes
2.1 Structure of transmission electron microscope
2.2 Observation mechanism of atoms by electrons
2.3 Information from electron diffraction pattern
2.4 High-resolution electron microscopy
2.5 Scanning electron microscope
2.6 Electron energy-loss spectroscopy
2.7 Energy dispersive X-ray spectroscopy
2.8 High-angle annular dark-field scanning TEM
2.9 Electron holography and Lorentz microscopy
2.10 Image simulation
3 Practice of HREM
3.1 Sample preparation
3.2 Specimen preparation methods
3.3 Structure analysis by X-ray diffraction
3.4 TEM observation
3.5 HREM observation
3.6 Fourier filtering
3.7 Resolution of HREM images
3.8 Prevention of damage and contamination
3.9 Taking images and reading data
3.10 Mental attitude for TEM
4 Characterization by HREM
4.1 What information can be obtained?
4.2 Direct atomic observation
4.3 Crystallographic image processing
4.4 Comparison of HREM image with calculated images
4.5 Atomic coordinates from HREM image