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Structural transformations of Ge[sub 2]Sb[sub 2]Te[sub 5] films studied by electrical resistance measurements

✍ Scribed by Friedrich, I.; Weidenhof, V.; Njoroge, W.; Franz, P.; Wuttig, M.

Book ID: 120050045
Publisher: American Institute of Physics
Year: 2000
Tongue: English
Weight: 371 KB
Volume: 87
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.373041

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