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Structural study of SiC(0 0 0 1)3×3 surface by surface X-ray diffraction

✍ Scribed by T. Aoyama; K. Akimoto; A. Ichimiya; Y. Hisada; S. Mukainakano; T. Emoto; H. Tajiri; T. Takahashi; H. Sugiyama; X. Zhang; H. Kawata

No coin nor oath required. For personal study only.

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