## Abstract The results of a study of oxide precipitates in Czochralski (CZ) grown silicon using two Xโray diffraction methods are reported. The diffuse scattering around the Bragg diffraction maxima was measured on a series of samples after various twoโstage annealing treatment. Combining the anal
โฆ LIBER โฆ
Structural Study of CHCl3Molecular Assemblies in Micropores Using X-ray Techniques
โ Scribed by Taku Iiyama; Yoshie Kobayashi; Atsushi Matsumoto; Yoshitaka Nakahigashi; Sumio Ozeki
- Publisher
- Springer
- Year
- 2005
- Tongue
- English
- Weight
- 438 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0929-5607
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