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Structural study of amorphous Al0.20As0.50Te0.30, Al0.10As0.40Te0.50 and Al0.10As0.20Te0.70 by x-ray diffraction (I)

✍ Scribed by Juan José Del Val; Luis Esquivias; Pedro Luis Olano; Francisco Sanz

No coin nor oath required. For personal study only.

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