Structural reproducibility of CdTe thin films deposited on different substrates by close space sublimation method

✍ Scribed by Potlog, T. ;Spalatu, N. ;Maticiuc, N. ;Hiie, J. ;Valdna, V. ;Mikli, V. ;Mere, A.

• Publisher: John Wiley and Sons
• Year: 2011
• Tongue: English
• Weight: 562 KB
• Volume: 209
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.201127123

✦ Synopsis

Abstract

We report on the characterization of polycrystalline CdTe thin films grown directly on glass, SnO~2~‐coated glass, and CdS/SnO~2~/glass at relatively low temperatures by employing the close space sublimation technique (CSS). The deposited films have been characterized by using optical absorption, X‐ray diffraction (XRD), scanning electron microscopy (SEM), and energy dispersive X‐ray analysis (EDX). Based on the SEM and optical analysis, the CdTe/CdS/SnO~2~/glass thin films exhibit a superior crystal quality and reproducibility in comparison to other CdTe films grown on glass and SnO~2~/glass. XRD study reveals that films are polycrystalline with a cubic crystal structure. The EDX characterization indicates that all CdTe thin films are nearly stoichiometric. The optical absorption study shows a larger variation of band gap from 1.485 to 1.495 eV for CdTe grown on SnO~2~‐coated glass.