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Structural Reliability of Yttria-Doped Hot-Pressed Silicon Nitride at Elevated Temperatures

โœ Scribed by S.M. WIEDERHORN; N.J. TIGHE


Book ID
110820633
Publisher
John Wiley and Sons
Year
1983
Tongue
English
Weight
974 KB
Volume
66
Category
Article
ISSN
0002-7820

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