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Structural relaxations in amorphous biphenyl. Raman spectroscopic studies

โœ Scribed by Kikujiro Ishii; Hideyuki Nakayama; Kunio Tanabe; Masataka Kawahara

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
316 KB
Volume
198
Category
Article
ISSN
0009-2614

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โœฆ Synopsis

Amorphous biphenyl films were prepared by vacuum evaporation onto cold metal substrates. Structural relaxations (SR) in the films were studied by in situ Raman measurements during annealing. Biphenyl molecules are twisted in the initial amorphous state as in the molten state. A gradual SR which causes increases in Raman-band intensities starts around 20 K. An abrupt SR occurs around 140 K irrespective of the initial temperature of the film preparation. These features of SR are discussed in comparison with those in amorphous p-terphenyl.

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