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Structural properties of V2O5 thin films prepared by vacuum evaporation

✍ Scribed by R.T. Rajendra Kumar; B. Karunagaran; V. Senthil Kumar; Y.L. Jeyachandran; D. Mangalaraj; Sa.K. Narayandass

Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
229 KB
Volume
6
Category
Article
ISSN
1369-8001

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## Abstract Thermally processed lead iodide (PbI~2~) thin films were prepared by the vacuum evaporation method in a constant ambient. Measured thickness of the film was verified analytically from the optical transmittance data in a wavelength range between 300 and 1600 nm. From the Tauc relation fo