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Structural properties and electronic transport in intrinsic microcrystalline silicon deposited by the VHF-GD technique

✍ Scribed by M. Goerlitzer; P. Torres; N. Beck; N. Wyrsch; H. Keppner; J. Pohl; A. Shah

Book ID: 117148968
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 128 KB
Volume: 227-230
Category: Article
ISSN: 0022-3093
DOI: 10.1016/s0022-3093(98)00257-9

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