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Structural, mechanical and tribological characterization of chromium oxide thin films prepared by post-annealing of Cr thin films

✍ Scribed by Khojier, K.; Savaloni, H.; Ashkabusi, Z.; Dehnavi, N.Z.

Book ID
120640242
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
716 KB
Volume
284
Category
Article
ISSN
0169-4332

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## Abstract Copper oxide thin films were obtained by annealing (temperature ranging between 100 and 450 °C) the metallic Cu films deposited on glass substrates by e‐beam evaporation. XRD studies confirmed that the cubic Cu phase of the as‐deposited films changes into single cubic Cu~2~O phase and s