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Structural localization of trace amounts of impurity ions in Langmuir-Blodgett films by the X-ray standing wave method

✍ Scribed by N. N. Novikova; S. I. Zheludeva; N. D. Stepina; A. L. Tolstikhina; R. V. Gaĭnutdinov; A. I. Erko; W. Haase; Yu. G. Galyametdinov

Book ID: 111437671
Publisher: SP MAIK Nauka/Interperiodica
Year: 2006
Tongue: English
Weight: 289 KB
Volume: 51
Category: Article
ISSN: 1063-7745
DOI: 10.1134/s1063774506060150

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