Structural Investigations on Self-Organized Si/SiGe Islands by Grazing Incidence Small Angle X-Ray Scattering

✍ Scribed by T. Roch; V. Holý; J. Stangl; E. Höflinger; A. Daniel; G. Bauer; I. Kegel; H. Metzger; J. Zhu; K. Brunner; G. Abstreiter

• Publisher: John Wiley and Sons
• Year: 2001
• Tongue: English
• Weight: 187 KB
• Volume: 224
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/1521-3951(200103)224:1<241::aid-pssb241>3.0.co;2-b