✦ LIBER ✦
Structural investigation of keV Ar-ion-induced surface ripples in Si by cross-sectional transmission electron microscopy
✍ Scribed by Chini, T. K.; Okuyama, F.; Tanemura, M.; Nordlund, K.
- Book ID
- 120246085
- Publisher
- The American Physical Society
- Year
- 2003
- Tongue
- English
- Weight
- 741 KB
- Volume
- 67
- Category
- Article
- ISSN
- 1098-0121
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