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Structural instability of tilted flux lattices

โœ Scribed by S.T. Chui


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
301 KB
Volume
83
Category
Article
ISSN
0038-1098

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## Abstract The series of samples is investigated to verify the validity of the scattering theory within the layers of different relaxation degree. The samples composed of In~0.06~Ga~0.94~As layer of different thicknesses on GaAs [001] substrates were grown using MBE technique. The symmetric and as