Structural Fault Modeling and Fault Detection Through Neyman–Pearson Decision Criteria for Analog Integrated Circuits

✍ Scribed by Amir Zjajo; Jose Pineda de Gyvez; Guido Gronthoud

• Book ID: 106384309
• Publisher: Springer US
• Year: 2006
• Tongue: English
• Weight: 439 KB
• Volume: 22
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/s10836-006-9499-1