Structural, electrical and optical properties of Dy doped ZnO thin films grown by buffer assisted pulsed laser deposition
β Scribed by R.S. Ajimsha; A.K. Das; B.N. Singh; P. Misra; L.M. Kukreja
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 281 KB
- Volume
- 42
- Category
- Article
- ISSN
- 1386-9477
No coin nor oath required. For personal study only.
β¦ Synopsis
Transparent conductive dysprosium doped ZnO (Dy:ZnO) thin films with preferential orientation in the (0 0 0 2) direction were deposited on (0 0 0 1) sapphire substrate by buffer assisted pulsed laser deposition. The experimental results show that the resistivity of Dy:ZnO thin films decreased to a minimum value of $ 7.6 Γ 10 Γ 4 O cm with increasing Dy concentration up to $ 0.45 at%, then increased with the further increase of Dy concentration. On the contrary, the band gap and carrier concentration of Dy:ZnO thin films initially increased, then decreased with increase of Dy concentration. The blue shift of band gap of Dy:ZnO thin films with increasing carrier concentration was attributed to the competing effects of Burstein-Moss shift and band gap narrowing. A bright room temperature photoluminescence observed at $ 575 nm in all the Dy:ZnO thin films, with maximum intensity at $ 0.45 at% of Dy doping, was attributed to be due to intra-band transitions of Dy 3 + in ZnO. Near band edge photoluminescence of ZnO was observed at $ 380 nm with photoluminescence intensity decreasing with increase of Dy concentration. Such Dy:ZnO thin films are found to be suitable candidate for luminescent device applications.
π SIMILAR VOLUMES
## Abstract InAs coβdoped ZnO films were grown on sapphire substrates by pulsed laser deposition. The grown films have been characterized using Xβray diffraction (XRD), Hall effect measurements, Atomic force microscope (AFM) and Field emission scanning electron microscope (FESEM) in order to invest