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Structural, electrical and optical characterization of MOCVD grown In-rich InGaN layers

✍ Scribed by Ö. Tuna; W.M. Linhart; E.V. Lutsenko; M.V. Rzheutski; G.P. Yablonskii; T.D. Veal; C.F. McConville; C. Giesen; H. Kalisch; A. Vescan; M. Heuken

Book ID: 116630392
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 1002 KB
Volume: 358
Category: Article
ISSN: 0022-0248
DOI: 10.1016/j.jcrysgro.2012.07.040

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