Dislocation and microindentation analysi
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A. G. Kunjomana; K. A. Chandrasekharan
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Article
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2008
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John Wiley and Sons
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English
⚖ 371 KB
The structural defects and microhardness of Bi 2 Te 3-x Se x whiskers (x = 0, 0.2 and 0.4 at % Se) grown by physical vapour deposition (PVD) method have been investigated. Concentric pairs of dislocation loops were observed on the as-grown surfaces of short hexagonal prisms. A systematic study of di