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Structural characterization of V2O5–TiO2 thin films deposited by RF sputtering from a titanium target with vanadium insets

✍ Scribed by I. Alessandri; E. Comini; E. Bontempi; G. Sberveglieri; L.E. Depero


Book ID
108263444
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
245 KB
Volume
109
Category
Article
ISSN
0925-4005

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