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Structural characterization of H plasma-doped ZnO single crystals by positron annihilation spectroscopies

✍ Scribed by Anwand, Wolfgang ;Brauer, Gerhard ;Cowan, Thomas E. ;Grambole, Dieter ;Skorupa, Wolfgang ;Čížek, Jakub ;Kuriplach, Jan ;Procházka, Ivan ;Egger, Werner ;Sperr, Peter


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
511 KB
Volume
207
Category
Article
ISSN
0031-8965

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✦ Synopsis


Abstract

Nominally undoped, hydrothermally grown ZnO single crystals have been investigated before and after exposure to remote H plasma. Structural characterizations have been made by various positron annihilation spectroscopies (continuous and pulsed slow positron beams, conventional lifetime). The content of bound hydrogen (H‐b) before and after the remote H plasma treatment at the polished side of the crystals was determined at depths of 100 and 600 nm, respectively, using nuclear reaction analysis. At a depth of 100 nm, H‐b increased from (11.8 ± 2.5) to (48.7 ± 7.6) × 10^19^ cm^−3^ after remote H plasma treatment, whereas at 600 nm no change in H‐b was observed.


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